| 摘要 |
The method for chemically differential imaging using a scanning force microscope uses chemically modified samples, where the imaging is in normal force, elasticity or tapping/non-contact mode. A detector (1), laser source (2), piezoelectric adjuster (3), tip and lever arm (4) are used to evaluate the sample (5). The scanning tip is either a metal or oxide layer, or it may be coated with one or more substances, such as thiol groups with additional acid or base functions, thiol with nuclein base, disulphide with acid base or nuclein base. |
