发明名称 Plasma etch process.
摘要 Process comprises: generating radicals in a plasma generator upstream of the etch chamber from a gas mixt. of O2 and/or water vapour and an F-contg. etchant gas; and contacting the resulting radicals with the substrate in the etch chamber. The content of O2 and/or water vapour in the gas is pref. 0.1-20 vol.% on F-contg. gas.
申请公布号 EP0651437(A3) 申请公布日期 1996.04.17
申请号 EP19940116658 申请日期 1994.10.21
申请人 APPLIED MATERIALS, INC. 发明人 HILLS, GRAHAM W.;BUCKNALL, RUTH E.
分类号 H01L21/302;H01L21/02;H01L21/3065;H01L21/311;H01L21/3213 主分类号 H01L21/302
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