发明名称 |
Plasma etch process. |
摘要 |
Process comprises: generating radicals in a plasma generator upstream of the etch chamber from a gas mixt. of O2 and/or water vapour and an F-contg. etchant gas; and contacting the resulting radicals with the substrate in the etch chamber. The content of O2 and/or water vapour in the gas is pref. 0.1-20 vol.% on F-contg. gas. |
申请公布号 |
EP0651437(A3) |
申请公布日期 |
1996.04.17 |
申请号 |
EP19940116658 |
申请日期 |
1994.10.21 |
申请人 |
APPLIED MATERIALS, INC. |
发明人 |
HILLS, GRAHAM W.;BUCKNALL, RUTH E. |
分类号 |
H01L21/302;H01L21/02;H01L21/3065;H01L21/311;H01L21/3213 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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