发明名称 Bit line load circuit
摘要 A bit line load circuit for a static random access memory comprising first and second P-channel MOSFETs for clamping a voltage difference between first and second bit lines at a predetermined level in a data reading operation and third and fourth P-channel MOSFETs for blocking a DC current flow to one of the first and second bit lines having a "low" level and performing a voltage compensation for the other having a "high" level in a data writing operation. The first bit line is active "high" and the second bit line is active "low". The first P-channel MOSFET has a drain connected to the first bit line, a source connected to a power source line and a gate connected to a write enable signal, the second P-channel MOSFET has a drain connected to the second bit line, a source connected to the power source line and a gate connected to the write enable signal, the third P-channel MOSFET has a drain connected to the first bit line, a source connected to the power source line and a gate cross-connected to the second bit line arid the fourth P-channel MOSFET has a drain connected to the second bit line, a source connected to the power source line and a gate cross-connected to the first bit line.
申请公布号 US5508961(A) 申请公布日期 1996.04.16
申请号 US19930174201 申请日期 1993.12.27
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. 发明人 HAN, GWANG M.
分类号 G11C11/417;G11C7/12;G11C11/409;G11C11/419;G11C17/12;(IPC1-7):G11C7/00 主分类号 G11C11/417
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