发明名称 Semiconductor integrated circuit device and a method for manufacturing the same
摘要 An improved arrangement is provided for forming a bipolar transistor on a substrate with CMOS elements. All of the transistors (i.e., the bipolar, P-MOS and N-MOS) are formed in regions having gradually decreasing impurity concentrations from the surface toward the substrate. In addition, a buried layer is provided under each of the regions of decreasing impurity concentration in which the transistors are formed. These buried layers have a significantly higher impurity concentration than the portion of the region of decreasing impurity concentration which they are respectively adjacent to. Using this arrangement, punch-through is prevented and excellent electrical operating characteristics are provided for both the bipolar transistors and the CMOS elements.
申请公布号 US5508549(A) 申请公布日期 1996.04.16
申请号 US19910735948 申请日期 1991.07.25
申请人 HITACHI, LTD. 发明人 WATANABE, ATSUO;IKEDA, TAKAHIDE;TSUKUDA, KIYOSHI;HIRAO, MITSURU;MUKAI, TOUJI;KAMEI, TATSUYA
分类号 H01L27/08;H01L21/8249;H01L27/06;H01L27/118;H01L29/68;H01L29/78;(IPC1-7):H01L27/02 主分类号 H01L27/08
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