SIMULATION EXECUTION SYSTEM OF TEST PROGRAM IN IC TESTING DEVICE,申请号JP19940237966-传众专利搜索

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发明名称	SIMULATION EXECUTION SYSTEM OF TEST PROGRAM IN IC TESTING DEVICE
摘要
申请公布号	JPH08101256(A)	申请公布日期	1996.04.16
申请号	JP19940237966	申请日期	1994.09.30
申请人	ANDO ELECTRIC CO LTD	发明人	YAMADA NAOMITSU
分类号	G01R31/26;G01R31/28;H01L21/66;(IPC1-7):G01R31/28	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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