发明名称 PROGRAMMABLE WIRING CIRCUIT AND TEST BOARD DEVICE
摘要 PURPOSE: To remove influence of a wiring delay, raise the degree of freedom of a wiring and contrive to enhance use efficiency by a method wherein a bypass wiring has beforehand been arranged so that a various-purpose wiring is bypassed every predetermined length. CONSTITUTION: Input and output terminals 12 are regularly arranged on a semiconductor chip 11. Input and output lines 13 for transmitting or receiving data between the input and output terminals 12 and a wiring path within a chip are arranged with respect to these input and output terminals 12, respectively. Various-purpose wires 14, 15 are formed in the semiconductor chip 11 to form an optical wiring path. Further, bypass wires 16, 17 for bypassing these various-purpose wires 14, 15 every predetermined length are arranged. A wiring connection point 18 is arranged in an array-like form in each intersecting point location of the input and output lines 13, the various-purpose wires 14, 15 and the bypass wires 16, 17 and is a program element capable of changing a connection state with respect to each other and controlling a wiring path.
申请公布号 JPH08102492(A) 申请公布日期 1996.04.16
申请号 JP19940289689 申请日期 1994.11.24
申请人 TOSHIBA CORP 发明人 SHIRASAGO TOSHIAKI;SEKIZAWA YUICHI;AOKI TAE
分类号 G01R31/28;G06F11/22;H01L21/82 主分类号 G01R31/28
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