发明名称 ALIGNMENT DEVICE FOR SEMICONDUCTOR CHIP GIVEN ALIGNMENT MARK, AND ALIGNMENT METHOD USING THE ALIGNMENT MARK
摘要 PURPOSE: To detect the dislocation in X direction and Y direction and in rotation by forming at least tow line patterns not parallel with the direction of scanning of a scan beam used for scanning an alignment mark and besides not parallel with each other. CONSTITUTION: An alignment mark 90 consists of two line patterns. And, each line pattern is made to be neither parallel nor vertical to the direction of scanning 92, and so that the angle of crossing may be not less than 1 deg. and not more than 90 deg.. Moreover, the two line patterns are not made in parallel, and cross each other on the extension of the line pattern like a V shape. Letting the distance being obtained from the peak value a of the signal obtained by the scanning of the laser beam be Aμm and the distance to the peak value b be Bμm, the coordinate value in X direction shifted due to the movement of the alignment mark 90 can be found from the values Aμm and Bμm.
申请公布号 JPH0897135(A) 申请公布日期 1996.04.12
申请号 JP19950181840 申请日期 1995.07.18
申请人 TOSHIBA CORP 发明人 SENDA SHINYA
分类号 G03F9/00;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F9/00
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