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发明名称
COMPARISON CIRCUIT FOR SEMICONDUCTOR TESTING DEVICE
摘要
申请公布号
JPH0894710(A)
申请公布日期
1996.04.12
申请号
JP19940254355
申请日期
1994.09.22
申请人
ADVANTEST CORP
发明人
SUZUKI MASAYUKI
分类号
G01R31/28;(IPC1-7):G01R31/28
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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