Process and device for microwave surface resistance determination

摘要

PCT No. PCT/DE93/00105 Sec. 371 Date Oct. 14, 1994 Sec. 102(e) Date Oct. 14, 1994 PCT Filed Feb. 9, 1993 PCT Pub. No. WO93/16393 PCT Pub. Date Aug. 19, 1993.A process for determining a surface resistance to microwave energy of a superconductive film provides a metallic cavity resonator whose resonator cavity is defined by metallic walls, and positioning a superconductive film whose microwave surface resistance is to be measured as at least part of a wall of the cavity. A dielectric body is applied to a surface of the film and microwave energy is coupled to the cavity through an input antenna and microwave energy is coupled out of the cavity by an output antenna at which signals are produced as a measure of the microwave surface resistance of the film.