发明名称 SCAN DATA TRANSITION CIRCUIT
摘要 The format of scan data is changed by option switches deposied in a key matrix so that functions of key is expanded. The circuit comprises a matrix switch(22) for generating scan data, a scan decoder(24) for generating an option data by decoding the scan data generated by the matrix switch(22) and for generating a first and a second clock signal, a first and a second latch(26,28) for latching the first and the second data according to the first and the second clock signal, and an adder(30) for selecting the output signals of the first and the second latch according to the option data.
申请公布号 KR960004571(B1) 申请公布日期 1996.04.09
申请号 KR19890006587 申请日期 1989.05.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOE, WOO - SUNG
分类号 G06F3/023;H03M11/14;H03M11/20;(IPC1-7):H03K19/177 主分类号 G06F3/023
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