| 摘要 |
A tester for measuring the resistance of magnetoresistive heads as a function of the magnetic field applied to the heads is disclosed. The tester applies a time varying magnetic field to the magnetoresistive head to be tested and filters the resulting time varying (AC) voltage signal indicative of the resistance of the head with a capacitor to remove the DC component of the signal. The AC component of the signal is then amplified, digitized, and analyzed to obtain the resistance properties of the magnetoresistive head.
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