| 摘要 |
<p>A test device is disclosed having a semicrater sample application site attached or associated with a substrate. The semicrater sample application site has walls of nonuniform height surrounding the area designed to receive the application of sample. In particular, the walls of the semicrater on one side are higher than the walls of the semicrater on the opposite side. This facilitates the application of a small amount of sample directly onto the desired sample application site.</p> |
