发明名称 Process for Manufacturing Semiconductor Device and Semiconductor Wafer
摘要 <p>There is provided a process for manufacturing a semiconductor device. Chip sections 10a are defined on a wafer 10 by scribe lines 13 with each chip section 10a having chip electrodes 11 formed thereon. The wafer 10 is covered with a passivating film 12 except for on the chip electrodes 11. Aluminum interconnection layers 60 are provided such that each layer 60 is connected to the chip electrode 11 at one end thereof and the other end of the layer 60 is extended towards the central portion of the chip section 10a. A cover coating film 64 is applied on the passivating film 12 and the layers 60. A number of apertures 66 are formed in the coating film 64 passing therethrough, and bump electrodes 70 are formed at the position corresponding to the apertures 66. The chip sections 10a are then separated from each other along the scribe lines 13 into semiconductor devices 80. <IMAGE></p>
申请公布号 CA2159242(A1) 申请公布日期 1996.03.31
申请号 CA19952159242 申请日期 1995.09.27
申请人 NEC CORPORATION 发明人 KATA, KEIICHIRO;CHIKAKI, SHINICHI
分类号 H01L21/60;H01L21/78;H01L23/12;H01L23/485;(IPC1-7):H01L21/02;H01L23/50;H01L23/48;H01L23/482;H01L23/52;H01L21/28 主分类号 H01L21/60
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