发明名称 Halbleiter-Verbundelement und Verfahren zum Detektieren von Fehlerzuständen in einer das Element enthaltenden Wechselrichtereinrichtung
摘要 A semiconductor composite element for controlling an invertor, in which abnormal conditions of overcurrent, control supply voltage reduction and overheat are detected, and different abnormality signals are outputted according to the respective abnormal conditions thus detected, comprises: abnormal condition detecting means 31a, 31b, 32a, 32b, 33 and 34 for detecting overcurrent, control supply voltage reduction of any or all of the plurality of semiconductor switching elements 27a, 27b, and overheating of the element. Abnormality signal generating means 53 and 54 are provided for producing a plurality of different abnormality signals according to the respective abnormal conditions detected by the abnormal condition detecting means. <IMAGE>
申请公布号 DE19501373(A1) 申请公布日期 1996.03.28
申请号 DE19951001373 申请日期 1995.01.18
申请人 MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP 发明人 OKUMURA, NORIHIKO, NAGOYA, AICHI, JP
分类号 G01R19/165;H02H7/122;H02M1/00;H02M7/48;H03K17/08;H03K17/082;(IPC1-7):G01R31/26;H02M5/00 主分类号 G01R19/165
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