Verfahren zur Temperaturkompensation von optoelektronischen Bauelementen und insbesondere von optoelektronischen Halbleitern

摘要

The proposed method of temperature compensation for opto-electronic components, more specifically opto-electronic semiconductors, involves operation of the component under pre-determined constant conditions and measurement of a first, temperature-dependent characteristic value which is then compared with a comparison value determined under identical constant conditions but at a different temperature. A correction function is derived from the relationship between the characteristic value and the comparison value and used to correct the measured value obtained from the semiconductor component so as to compensate for the effect of temperature.