发明名称 A field controlled semiconductor device of SiC and a method for production thereof
摘要 A field controlled semiconductor device of SiC has a drain, a highly doped substrate layer on top of the drain and a low doped n-type drift layer on top of the substrate layer. A p-type base layer is located on the drift layer and a vertical trench extends through the base layer. In the trench an n-type channel region extends vertically along a wall of the trench and connects a source region layer to the drift layer. A gate electrode is arranged in the trench to be on the opposite side of the channel region with respect to the base layer.
申请公布号 SE9601179(D0) 申请公布日期 1996.03.27
申请号 SE19960001179 申请日期 1996.03.27
申请人 ABB RESEARCH LTD 发明人 MIETEK *BOKOWSKI;CHRISTOPHER *HARRIS;ULF *GUSTAFSSON;MATS *ANDERSSON
分类号 H01L21/04;H01L29/24;H01L29/739;H01L29/745;H01L29/749;(IPC1-7):H01L/ 主分类号 H01L21/04
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