A method and an apparatus for flaw detection.,申请号EP19940107564-传众专利搜索

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发明名称	A method and an apparatus for flaw detection.
摘要
申请公布号	EP0629852(A3)	申请公布日期	1996.03.27
申请号	EP19940107564	申请日期	1994.05.16
申请人	DAIDO TOKUSHUKO KABUSHIKI KAISHA	发明人	ENDO, TOSHIO;YAGI, TOMIKAZU;YAMADA, RYUZO;ISHIKAWA, NOBUO;YANO, TAIZO
分类号	G01N25/72;(IPC1-7):G01N25/72	主分类号	G01N25/72
代理机构		代理人
主权项
地址

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