发明名称 SUBSTRATE TREATING DEVICE
摘要 PURPOSE: To improve the throughput of a substrate treating device at the time of manufacturing a semiconductor element, etc., by reducing the number of carrying shafts and shortening the wafer exchanging time, and then, simplifying or omitting a pre-alignment mechanism in an exposing device. CONSTITUTION: After a wafer 10 is taken out from a cassette 9 by means of a carrying arm 12, the wafer 10 is moved to a photoresist applying section 18 by moving the arm 12 along a slider main body 11 and a photoresist is applied to the wafer 10. Then the wafer 10 is centered at an angular position by a positioning section 17 and loaded in the same state on the wafer holder 31 of a projection exposing device 21 trough the arm 12. After exposure, the wafer 10 is unloaded from the holder 31 by means of a carrying arm 38 on a developing device 36 side by moving the holder 31 in +X direction.
申请公布号 JPH0883750(A) 申请公布日期 1996.03.26
申请号 JP19940217216 申请日期 1994.09.12
申请人 NIKON CORP 发明人 AOYAMA MASAAKI
分类号 G03F9/00;G03F7/20;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F9/00
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