发明名称 MULTILAYER FORMING METHOD OF SEMICONDUCTOR DEVICE
摘要 The method for forming wiring layers of at least two layers on a wiring(5) formed on a substrate(1), comprises the steps of: (i) forming a first insulation film(2-1') and a first light exposure film(3') which are twice or more of the wiring(5) in thickness, and baking the light exposure film(3'); (ii) forming a pattern of the light exposure film(3'), forming a preliminary contact window(13') by etching about half of the insulation film(2-1'), and removing the light exposure film(3'); (iii) forming a second insulation film(2-1") and a second light exposure film(3"), baking the light exposure film(3'), forming a pattern of the light exposure film(3"), and simultaneously forming the wiring seat(14) and the contact window(16) by reactive ion etching process; (iv) forming other wiring(7) by depositing a metal, and removing the light exposure film(3"); and (v) repeating the steps of (i)-(iv) for two or more times.
申请公布号 KR960004080(B1) 申请公布日期 1996.03.26
申请号 KR19920025003 申请日期 1992.12.22
申请人 KOREA ELECTRONICS & TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 CHOE, YOUNG - KYU;CHOE, KYUNG - IK
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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