发明名称 ELECTRIC ERASURE METHOD OF NONVOLATILIZATION SEMICONDUCTOR MEMORY DEVICE AND ITS CIRCUIT
摘要 <p>PROBLEM TO BE SOLVED: To obtain EEPROM's capable of collectively erasing a memory block to be erased. SOLUTION: A block selection circuit 60 is provided for memory blocks obtained by dividing a memory cell array having a NAND cell in a row direction and comprises storing means 29. The storing means 29 corresponding to the memory block to be erased stores a block selection flag of logic 1, and the storing means 29 corresponding to the memory block not to be erased stores a reset flag of logic 0. Erasing is performed by utilizing each of stored flags. By the block selection circuit 60 storing a block selection flag, a word line of the memory block to be erased is set to be at an erasing voltage, and by the block selection circuit 60 storing a reset flag, a word line of the memory block not to be erased is floating.</p>
申请公布号 JPH0877782(A) 申请公布日期 1996.03.22
申请号 JP19950226817 申请日期 1995.09.04
申请人 SAMSUNG ELECTRON CO LTD 发明人 KEN SHIYAKUSEN;KIN CHINKI
分类号 G11C17/00;G11C14/00;G11C16/02;G11C16/04;G11C16/06;G11C16/08;G11C16/16;G11C16/34;(IPC1-7):G11C16/06 主分类号 G11C17/00
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