发明名称 OPERATION SPEED MEASURING CIRCUIT AND SEMICONDUCTOR DEVICE EQUIPPED WITH THIS CIRCUIT
摘要 PURPOSE: To provide a operation speed measuring circuit capable of controlling with the minimum number of terminals and remarkably increase the freedom of circuit design by using this circuit. CONSTITUTION: The operation speed measuring circuit which measures the difference between the propagation delay times of a first path 2 and a second path 3, in which logic gates are connected in series, and confirms that a device on a chip obtains a specified operation speed is controlled by an input signal IN from one input terminal 1, therefore it can be set in the region where the number of terminals capable of arranging is limited to a small number. If a power supply-use terminal is set independent of other circuit in the operation speed measuring circuit, other circuit is capable of independently designing. When the region where the operation speed measuring circuit is set is independent of other integrated circuit design region, the freedom of other circuit design is increased. If the independent region is the corner part of a semiconductor chip, which is needed to leave as an empty space so far, the freedom of the circuit design is further increased.
申请公布号 JPH0875823(A) 申请公布日期 1996.03.22
申请号 JP19940210175 申请日期 1994.09.02
申请人 TOSHIBA MICROELECTRON CORP;TOSHIBA CORP 发明人 UMEMOTO YASUNOBU;SEI TOSHIKAZU;DOKE KATSURO;HAN EIJI
分类号 G01R31/28;G01R31/30;H01L21/66;H01L21/82;H01L21/822;H01L27/04;H03K5/13;(IPC1-7):G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项
地址