| 摘要 |
PURPOSE: To detect the temperature of a semiconductor device under operating state with no lag in the detecting operation while suppressing the fluctuation. CONSTITUTION: A pair of series circuits 10, 20 of constant current means 11, 21 and impedance means 12, 22 are provided and both means 11, 21 are connected between a power supply potential point Vs and a reference potential point Ve while reversing the order thereof. Potentials V1, V2 at the joints of the constant current means 11, 21 and the impedance means 12, 22 are derived from the series circuits 10, 20 and delivered, respectively, to one and the other inputs of a comparison means 30, i.e., an operational amplifier or a comparator. At least one of the constant current means 11, 21 and one of the impedance means 12, 22 are built in the temperature detecting part in the vicinity of heat generating part in a semiconductor chip device and the output from the comparison means 30 is taken out as a temperature detection signal Sd representative of the temperature Td of the semiconductor device. |
