| 摘要 |
PURPOSE: To provide a test equipment capable of starting test always in a specified short time of an integrated circuit device to be tested. CONSTITUTION: A flip-flop circuit 6 is reset, a gate circuit 2 is opened, and an initialization-use clock signal is supplied to an integrated circuit device from a clock signal generator 1. When a comparison circuit 4 detects initialization completion of the integrated circuit device, the gate circuit 2 is closed, supply of the initialization-use clock signal to the integrated circuit device is prohibited. When generation of the initialization-use clock signal from the clock signal generator 1 is completed, the gate circuit 2 is opened, and a test-use clock signal is supplied to the integrated circuit device. |
