发明名称 |
MANUFACTURING PROCESS OF SEMICONDUCTOR DEVICE |
摘要 |
forming a first conduction layer having irregular surface on a substrate; forming a first conduction pattern by etching the first conduction layer; forming an insulation film thereon; forming a mask pattern for etching by etching-back the insulation film; and partially etching the first conduction pattern using the etching mask. Formation of a storage electrode with a micro trench enhances cell capacitance.
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申请公布号 |
KR960003776(B1) |
申请公布日期 |
1996.03.22 |
申请号 |
KR19920017123 |
申请日期 |
1992.09.19 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, YOUNG - WOO;NOH, JOON - YONG;SIM, SANG - PILL |
分类号 |
H01L27/04;H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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