发明名称 MANUFACTURING PROCESS OF SEMICONDUCTOR DEVICE
摘要 forming a first conduction layer having irregular surface on a substrate; forming a first conduction pattern by etching the first conduction layer; forming an insulation film thereon; forming a mask pattern for etching by etching-back the insulation film; and partially etching the first conduction pattern using the etching mask. Formation of a storage electrode with a micro trench enhances cell capacitance.
申请公布号 KR960003776(B1) 申请公布日期 1996.03.22
申请号 KR19920017123 申请日期 1992.09.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, YOUNG - WOO;NOH, JOON - YONG;SIM, SANG - PILL
分类号 H01L27/04;H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/04
代理机构 代理人
主权项
地址