发明名称 X-ray position measuring and calibration device
摘要 A calibration system having a radiation source that generates the beam of radiation along the angular directions theta , phi . A first reference element which is separated from the radiation source by a distance of approximately Z1 is then exposed to the beam of radiation. A second reference element is also present which is separated from the first reference element by a predetermined distance H and is exposed to the beam of radiation. An image detector produces images of the first and second reference elements, wherein the images are separated from each other by a distance R and angle phi . The device further includes an angle measurement device that calculates theta from the values of Z1 and H. A position measurement device having first and second sources of radiation that generate respective first and second beams of radiation directed at angles theta 1, phi 1, and theta 2, phi 2 respectively, toward an object of interest. An image detector is provided for producing 1) a first image of the object of interest formed by the first beam of radiation and 2) a second image of the object of interest formed by the second beam of radiation and that is separated from the first image by a distance L. A coordinate device then determines the coordinate of the object of interest from the values of theta 1, theta 2 and L.
申请公布号 US5500886(A) 申请公布日期 1996.03.19
申请号 US19940224634 申请日期 1994.04.06
申请人 THERMOSPECTRA 发明人 DUFF, ERIC A.
分类号 G01T1/29;(IPC1-7):G01D18/00 主分类号 G01T1/29
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