发明名称 Dry etching method
摘要 A semiconductor material to be etched is held in a reaction chamber at a predetermined temperature. A reactive etching gas such as a chlorine gas is introduced into the reaction chamber for a first period of time. Thereafter, the reaction chamber is evacuated for a second period of time, and ultraviolet radiation is applied to the semiconductor material for a third period of time within the second period of time for thereby etching the semiconductor material to a depth on the order of a molecular or atomic layer.
申请公布号 US5500079(A) 申请公布日期 1996.03.19
申请号 US19940237417 申请日期 1994.05.03
申请人 RESEARCH DEVELOPMENT CORPORATION OF JAPAN 发明人 NISHIZAWA, JUN-ICHI;YAMAMOTO, KENJI
分类号 H01L21/302;H01L21/203;H01L21/268;H01L21/306;(IPC1-7):H01L21/00 主分类号 H01L21/302
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