发明名称 Traghalterung und Verfahren zur Herstellung der Traghalterung durch feine Oberflächenbearbeitung
摘要 A backing pad be used in a holding jig for holding a semiconductor wafer in the step of mirror polishing comprises a hydrophobic foam, possessed rigidity such that the defference between the thickness, T1, thereof under a load of 300 gf/cm<2> and the thickness, T2, thereof under a load of 1,800 gf/cm<2> (T1 - T2) is in the range of from 1 to 100 mu m, and has holes formed therein in a diameter in the range of 10 to 30 mu m through the wafer-holding surface thereof. The polishing of a semiconductor is effected by a method which comprises preparing a finished backing pad by the precision surface machining operation, setting the semiconductor wafer on a wafer holding jig having a template containing at least one wafer-positioning hole fixed on a carrier plate in such a manner that the backing pad enters the positioning hole , and polishing the semiconductor wafer. <IMAGE>
申请公布号 DE69116720(D1) 申请公布日期 1996.03.14
申请号 DE1991616720 申请日期 1991.04.18
申请人 SHIN-ETSU HANDOTAI CO., LTD., TOKIO/TOKYO, JP 发明人 HASHIMOTO, HIROMASA, NISHISHIRAKAWA-GUN, FUKUSHIMA-KEN, JP
分类号 B24B37/04;B24B37/30;H01L21/304;(IPC1-7):H01L21/304;H01L21/68 主分类号 B24B37/04
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