发明名称 Bipolar transistor free from leakage current across thin base region and process of fabrication thereof
摘要 <p>A bipolar transistor includes a base structure (31) in a hollow space (25a) on a single crystal silicon collector region (23a) defined by a silicon oxide layer (25), and the base structure has an extrinsic base (31c/31d) provided around a single crystal silicon emitter region (32a) and an intrinsic base layer (31a/31b) of single crystal silicon germanium decreasing the thickness from a central portion toward an outer periphery so as to decrease dislocation due to thermal stress in a heat treatment for the emitter region (32a). &lt;MATH&gt;</p>
申请公布号 EP0701287(A2) 申请公布日期 1996.03.13
申请号 EP19950114238 申请日期 1995.09.11
申请人 NEC CORPORATION 发明人 SATO, FUMIHIKO
分类号 H01L29/73;H01L21/331;H01L29/10;H01L29/732;H01L29/737;(IPC1-7):H01L29/737 主分类号 H01L29/73
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