发明名称 Package structure of a semiconductor device having a built-in capacitor
摘要 <p>A semiconductor device includes an insulating board (101,201), a multilayered wiring layer (102,202), a semiconductor element (105,205), a power noise reduction capacitor (103,203), and a heat sink (107,207). The insulating board has a first surface (101b,201b) on which an external lead (111,211) is arranged and a second surface (101a,201a) on which a wiring layer connected to the external lead through a through hole is formed. The multilayered wiring layer is formed on the second surface of the insulating board and has a surface on which an electrode terminal electrically connected to the wiring layer of the insulating board is formed. The semiconductor element is arranged such that the lower surface of the semiconductor element on which an electrode is formed is opposite to the multilayered wiring layer, and the electrode is connected to the electrode terminal through a lead. The power noise reduction capacitor is arranged between the multilayered wiring layer and the semiconductor element. The heat sink is fixed on the upper surface of the semiconductor element. <IMAGE></p>
申请公布号 EP0542532(B1) 申请公布日期 1996.03.13
申请号 EP19920310310 申请日期 1992.11.12
申请人 NEC CORPORATION 发明人 MIZUNASHI, HARUMI
分类号 H01L25/00;H01L23/04;H01L23/057;H01L23/367;H01L23/64;(IPC1-7):H01L23/057 主分类号 H01L25/00
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