发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURE
摘要 <p>PURPOSE: To easily perform test and manufacture and to reduce cost for the semiconductor device of BGA structure and its manufacturing method. CONSTITUTION: A connection part 26 which is electrically connected to an electrode pad 23 of a semiconductor chip 22 is formed on a resin film 24 and is connected to an external pad 28 and an external terminal 30 via a pattern 27 at the upper portion of a semiconductor from the connection part 26. Also, a test pad 29 which is connected via a pattern 27 extended from the connection part is formed at a test region outside the semiconductor chip of the resin film 24 and at the same time a hole 34 for mounting and feeding carriers is formed.</p>
申请公布号 JPH0870024(A) 申请公布日期 1996.03.12
申请号 JP19940203980 申请日期 1994.08.29
申请人 FUJITSU LTD 发明人 TAKENAKA MASAJI;YAMASHITA TATSURO
分类号 H01L21/66;H01L21/60;H01L23/12;(IPC1-7):H01L21/66 主分类号 H01L21/66
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