发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURE |
摘要 |
<p>PURPOSE: To easily perform test and manufacture and to reduce cost for the semiconductor device of BGA structure and its manufacturing method. CONSTITUTION: A connection part 26 which is electrically connected to an electrode pad 23 of a semiconductor chip 22 is formed on a resin film 24 and is connected to an external pad 28 and an external terminal 30 via a pattern 27 at the upper portion of a semiconductor from the connection part 26. Also, a test pad 29 which is connected via a pattern 27 extended from the connection part is formed at a test region outside the semiconductor chip of the resin film 24 and at the same time a hole 34 for mounting and feeding carriers is formed.</p> |
申请公布号 |
JPH0870024(A) |
申请公布日期 |
1996.03.12 |
申请号 |
JP19940203980 |
申请日期 |
1994.08.29 |
申请人 |
FUJITSU LTD |
发明人 |
TAKENAKA MASAJI;YAMASHITA TATSURO |
分类号 |
H01L21/66;H01L21/60;H01L23/12;(IPC1-7):H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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