发明名称 QUANTIZATION STRUCTURE PRODUCING METHOD
摘要 PURPOSE: To easily produce a nanometer order quantization structure at low temperature by a method wherein different kind of amorphous semiconductor hetero-structural film is provided on a semiconductor single crystal structure so as to be irradiated with X-rays for crystallization. CONSTITUTION: A hetero-structural film 5 comprising an amorphous Alx Ga1-x As 2/amorphous GaAs 3/amorphous Aly Ga1-y As 4 is deposited on a GaAs single crystal substrate 1. Next, this amorphous hetero structural film 5 is irradiated with nanometer order fine beams formed of convergent mirror, etc., or X-ray interference fringe beams 6 in nanometer order fringe intervals by crystallization to be selectively crystallized. In such a constitution, the amorphous state of non-crystallized region 5 is in high resistance state while the crystallized region 10 of crystallized Alx Ga1-x As 7/crystallized GaAs 8/crystallized Aly Ga1-y As 9 is of nanometer size so that the crystallized region 10 may fill the role of a quantum dot structure when the irradiated X-rays are fine beams while filling the role of a quantum wire structure when the irradiated X-rays are the interference fringe beams.
申请公布号 JPH0869966(A) 申请公布日期 1996.03.12
申请号 JP19940205211 申请日期 1994.08.30
申请人 NIPPON HOSO KYOKAI <NHK> 发明人 SATO SHIRO;HIRANO YOSHIYUKI;GOTO KATSUYUKI;EGAMI NORIFUMI
分类号 H01L21/20;H01L21/265;H01L29/06;H01L29/12;H01L29/20;(IPC1-7):H01L21/20 主分类号 H01L21/20
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