发明名称 Method and apparatus for detecting positional deviation by using diffraction gratings with a compensation delay determining unit
摘要 A method and apparatus for measuring relative positional deviation between first and second diffraction gratings formed on an object is disclosed, wherein, in detection of a signal corresponding to the relative positional deviation between the first and second diffraction gratings, a suitable delay is determined in accordance with a signal corresponding to a relative positional deviation between third and fourth diffraction gratings formed on the object and having a predetected relative positional deviation, and wherein the measurement of the positional deviation between the first and second diffraction gratings is done on the basis of a signal corresponding to that deviation and of the delay thus determined.
申请公布号 US5498878(A) 申请公布日期 1996.03.12
申请号 US19940353236 申请日期 1994.12.02
申请人 CANON KABUSHIKI KAISHA 发明人 HASEGAWA, NORIYASU;MORI, TETSUZO
分类号 G01B11/00;G03F7/20;H01L21/027;(IPC1-7):G01N21/86 主分类号 G01B11/00
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