发明名称 |
Method and apparatus for detecting positional deviation by using diffraction gratings with a compensation delay determining unit |
摘要 |
A method and apparatus for measuring relative positional deviation between first and second diffraction gratings formed on an object is disclosed, wherein, in detection of a signal corresponding to the relative positional deviation between the first and second diffraction gratings, a suitable delay is determined in accordance with a signal corresponding to a relative positional deviation between third and fourth diffraction gratings formed on the object and having a predetected relative positional deviation, and wherein the measurement of the positional deviation between the first and second diffraction gratings is done on the basis of a signal corresponding to that deviation and of the delay thus determined.
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申请公布号 |
US5498878(A) |
申请公布日期 |
1996.03.12 |
申请号 |
US19940353236 |
申请日期 |
1994.12.02 |
申请人 |
CANON KABUSHIKI KAISHA |
发明人 |
HASEGAWA, NORIYASU;MORI, TETSUZO |
分类号 |
G01B11/00;G03F7/20;H01L21/027;(IPC1-7):G01N21/86 |
主分类号 |
G01B11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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