发明名称 |
WIRE OF HIGH ASPECT AND LOW RESISTIVITY DUE TO SURFACE DIFFUSION / VIA STRUCTURE AND ITS MANUFACTURE |
摘要 |
PROBLEM TO BE SOLVED: To fill the line of a high aspect ratio without voids at a temperature far lower than that of a conventional method by using a low-temperature germanium air flow for affecting a metal and an alloy stuck to a high aspect ratio structure provided with the line and via. SOLUTION: A dielectric 10 is overcoated, and an opening 11 is formed on a substrate first. Thereafter, an appropriate material 12 of Al-Cu or the like is stuck after Ti by PVD. A metal and an alloy include a first element from the group of gold and silver and the second element of Ge. It is preferable that the metal alloy be provided with a first region of Ge in the range of atomic percentage of 0-40 and the second region of Ge in the range of atomic percentage of 60-100. Thereafter, a sintered hard alloy layer 13 is stuck, GeH4 gas is made to flow, and the via is filled. Preferably metallization 14 is Alx Cuy . After making this structure and GeH4 react, a side seam is filled by a low fusing point eutectic alloy 15. |
申请公布号 |
JPH0864599(A) |
申请公布日期 |
1996.03.08 |
申请号 |
JP19950196745 |
申请日期 |
1995.08.01 |
申请人 |
INTERNATL BUSINESS MACH CORP <IBM> |
发明人 |
RAJIBU BUASANTO JIYOSHII;MANU JIYAMUNADAASU TEJIWAANI;KURISU BUENKATORAAMAN SHIYURIIKURIYUSHIYUNAN |
分类号 |
H01L21/28;H01L21/203;H01L21/205;H01L21/3205;H01L21/321;H01L21/768;H01L23/52;H01L23/522;H01L23/532;(IPC1-7):H01L21/320 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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