| 摘要 |
PURPOSE: To test a high-speed interface part of LSI by using a high-speed SLI tester, having a minimum number of pins less than the number of all function terminals of the LSI to be inspected. CONSTITUTION: A selector 24 brings the input data of a high-speed interface back to an output part through a loop. An FIFO buffer 16 temporarily stores loop-back data. A sequencer 17 controls the loop-back operation. These parts are provided. Thus, the data inputted from the high-speed interface part are brought back to the high-speed interface part as the output data by way of the loop, and the testing is performed with an LSI tester. |
