发明名称 |
An apparatus for measuring the contour of a surface |
摘要 |
An apparatus for measuring the contour of a surface includes a high intensity light source and optics for projecting a line off light on the surface to illuminate a selected contour feature of the surface. An optical detector generates an image of the selected contour feature illuminated by the line of light, and a processing unit fits at least one contour segment to the image of the selected contour feature and determines contour characteristics from the contour segment. <MATH> |
申请公布号 |
EP0699890(A1) |
申请公布日期 |
1996.03.06 |
申请号 |
EP19940305718 |
申请日期 |
1994.08.02 |
申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
DONALDSON, CHARLES WAYNE;LESTAGE, JOHN JOSEPH;MILLER, KENNETH E.;GANTNER, RANDALL CLAY |
分类号 |
G01B11/25 |
主分类号 |
G01B11/25 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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