发明名称 An apparatus for measuring the contour of a surface
摘要 An apparatus for measuring the contour of a surface includes a high intensity light source and optics for projecting a line off light on the surface to illuminate a selected contour feature of the surface. An optical detector generates an image of the selected contour feature illuminated by the line of light, and a processing unit fits at least one contour segment to the image of the selected contour feature and determines contour characteristics from the contour segment. <MATH>
申请公布号 EP0699890(A1) 申请公布日期 1996.03.06
申请号 EP19940305718 申请日期 1994.08.02
申请人 GENERAL ELECTRIC COMPANY 发明人 DONALDSON, CHARLES WAYNE;LESTAGE, JOHN JOSEPH;MILLER, KENNETH E.;GANTNER, RANDALL CLAY
分类号 G01B11/25 主分类号 G01B11/25
代理机构 代理人
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