A HIGH SPEED IDDQ MONITOR CIRCUIT

摘要

A process for determining a quiescent power supply current (IDDQ) of a device under test (DUT) (100) at a first node (215). The process includes the steps of providing a reference current to the first node (215) and decoupling a power supply (205) from the first node (215). A first node voltage is determined at a first time after the power supply (205) is decoupled from the first node (215). The first node voltage is determined at a second time after the first time. If the first node voltage increases from the first time to the second time, it is indicated that the IDDQ of the DUT (100) is less than the reference current. If the first node voltage decreases from the first time to the second time, it is indicated that the IDDQ of the DUT (100) is greater than the reference current.