发明名称 PRESSURE PLATE AND POLISHING DEVICE USING IT
摘要 PURPOSE:To provide a polishing device which can uniform load distribution over a semiconductor wafer. CONSTITUTION:A pressure plate 4 in a polishing device is composed of a first plate 1 is composed of a first plate 1, attached at the center of its one surface with a pressure rod 3, a second plate positioned facing the first plate 1 and adapted to hold a semiconductor wafer 8, and a load distributing ring 11 located between the first and second plates 1, 2, for distributing a load applied upon the first plate and directed toward a base plate 5 before the load is transmitted to the second plate 2. With this arrangement in which the load applied around the center of the first plate 1 by the pressure rod 3 is distributed by the distributing ring 11 and then is transmitted to the second plate 2, and the load is uniformly applied over the semiconductor wafer 8 supported to the second plate 2, thereby it is possible to polish the semiconductor surface with a high degree of flatness.
申请公布号 JPH0847854(A) 申请公布日期 1996.02.20
申请号 JP19940182233 申请日期 1994.08.03
申请人 HITACHI LTD;HITACHI TOKYO ELECTRON CO LTD 发明人 YUI HAJIME;KAIDA HIROMASA;NISHIYORI KENICHI
分类号 B24B37/005;B24B37/30;H01L21/304 主分类号 B24B37/005
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