发明名称 Method of forming a semiconductor device having a LC element
摘要 An LC element with a pn junction layer formed near the surface of a p-Si substrate by forming an n+ region having a predetermined shape and in a portion thereof additionally forming a p+ region having the same shape, and with first and second electrodes formed over entire length on the surface of this pn junction layer; wherein the two electrodes respectively function as inductors and by using the pn junction layer with reverse bias, a distributed constant type capacitor is formed between these inductors, thereby providing excellent attenuation characteristics over a wide band, a semiconductor device including the LC element, and a method of manufacturing the LC element. This LC element and semiconductor device can be easily manufactured; in the case of manufacturing as a portion of an IC or LSI device, component assembly work in subsequent processing can be abbreviated, and by changing the capacitance of the distributed constant type capacitor according to requirements, the characteristics can be changed.
申请公布号 US5492856(A) 申请公布日期 1996.02.20
申请号 US19950460165 申请日期 1995.06.02
申请人 IKEDA, TAKESHI;OKAMURA, SUSUMU 发明人 IKEDA, TAKESHI;OKAMURA, SUSUMU
分类号 H01L27/08;H03H7/01;(IPC1-7):H01L21/70;H01L27/00 主分类号 H01L27/08
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