发明名称 |
ELECTRICALLY RESISTIVE STRUCTURE |
摘要 |
An electrically resistive structure comprising a substrate (11) which is provided on at least one side with a first resistive film (13) and a second resistive film (17), the materials of these first and second films (13, 17) being mutually different, whereby an anti-diffusion film (15) is disposed between the first and second films (13, 17). The presence of such an anti-diffusion film (15) allows annealing of the resistive structure without significant degradation of its resistive properties. Suitable alloy materials for use in such an anti-diffusion film (15) include WTi, and particularly WTiN. Appropriate exemplary materials for the first resistive film (13) and second resistive film (17) include SiCr and CuNi alloys, respectively.
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申请公布号 |
WO9604668(A1) |
申请公布日期 |
1996.02.15 |
申请号 |
WO1995IB00565 |
申请日期 |
1995.07.17 |
申请人 |
PHILIPS ELECTRONICS N.V.;PHILIPS NORDEN AB |
发明人 |
HEGER, ANTON;YOUNG, EDWARD, WILLEM, ALBERT |
分类号 |
H01C7/00;(IPC1-7):H01C7/00 |
主分类号 |
H01C7/00 |
代理机构 |
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地址 |
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