| 发明名称 |
Vorrichtung zum Aufsuchen von Störungen bei der Herstellung von phototechnisch realisierten Überzügen auf Leiterplatten. |
| 摘要 |
<p>An apparatus and method are disclosed for testing electrodeposition processes used in printed circuit board manufacture. The apparatus, having a photoresist pattern on a test printed circuit board, for use in a Hull Cell to determine efficiency, uniformity, and interactions of the process on the surface of the printed circuit board in order to provide for design rules and process specifications.</p> |
| 申请公布号 |
DE69022101(T2) |
申请公布日期 |
1996.02.15 |
| 申请号 |
DE1990622101T |
申请日期 |
1990.04.06 |
| 申请人 |
HEWLETT-PACKARD CO., PALO ALTO, CALIF., US |
发明人 |
ROHLEV, SLAV A., FORT COLLINS, COLORADO 80526, US |
| 分类号 |
G01N27/416;C25D7/00;G01N27/26;G03F7/26;H05K3/18;H05K3/24;(IPC1-7):H05K3/00;C25D17/00;H05K13/08 |
主分类号 |
G01N27/416 |
| 代理机构 |
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代理人 |
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