发明名称 Surface inspection system
摘要 <p>A surface inspection system including, a detection circuit for detecting an image of a surface fault in a runing sheet material, a fault area judgement circuit connected to the detection circuit for receiving the image and for determining a fault area including a cluster fault composed of the same type of fault parts, and a recognition circuit connected to the detection circuit for receiving the image, connected to the fault area judgement circuit for receiving the fault area, and for recognizing a type and a grade of the cluster fault included in the fault area. &lt;MATH&gt;</p>
申请公布号 EP0696733(A1) 申请公布日期 1996.02.14
申请号 EP19950305417 申请日期 1995.08.02
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 FUKAZAWA, CHIAKI, C/O INT.PROP.DIV., TOSHIBA CORP.
分类号 G01N21/89;G06T7/00;(IPC1-7):G01N21/89 主分类号 G01N21/89
代理机构 代理人
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