发明名称 |
Surface inspection system |
摘要 |
<p>A surface inspection system including, a detection circuit for detecting an image of a surface fault in a runing sheet material, a fault area judgement circuit connected to the detection circuit for receiving the image and for determining a fault area including a cluster fault composed of the same type of fault parts, and a recognition circuit connected to the detection circuit for receiving the image, connected to the fault area judgement circuit for receiving the fault area, and for recognizing a type and a grade of the cluster fault included in the fault area. <MATH></p> |
申请公布号 |
EP0696733(A1) |
申请公布日期 |
1996.02.14 |
申请号 |
EP19950305417 |
申请日期 |
1995.08.02 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
FUKAZAWA, CHIAKI, C/O INT.PROP.DIV., TOSHIBA CORP. |
分类号 |
G01N21/89;G06T7/00;(IPC1-7):G01N21/89 |
主分类号 |
G01N21/89 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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