| 摘要 |
PURPOSE:To reduce the generation of a defect in resistance value in a final inspecting process by measuring the offset quantity of the control signal of a VCO and performing inspection by using the correlation between the resistance value and offset quantity of a CR parallel charging and discharging circuit. CONSTITUTION:A semiconductor integrated circuit device 1 for FM stereophonic multiplex demodulation of a phase-locked loop (PLL) type which requires the CR parallel charging and discharging circuit 14 as an external circuit is regarded as an element to be inspected, and while a power source is connected to the device 1, a rectangular wave voltage is applied to the external terminal 13 of the device 1 to which the circuit 14 is connected to operate a circuit which constitutes the PLL in the device 1. Then, the offset quantity of the control signal of the VCO 6 is measured at the terminal 13 and probe inspection is performed to check whether or not the resistance value can be adjusted within a predetermined specific range from the correlation between the offset value and the resistance value of the variable resistance 15 of the circuit 14 which adjusts the oscillation frequency of the VCO 6 in the absence of the input of the device 1 to a prescribed value. |
