发明名称 DIRECT DIGITAL SYNTHESIS COMPONENT TEST
摘要 A "component test" function is provided in a low-power, portable test instrument like a digital multimeter. A test stimulus waveform is synthesized digitally, and a digital trigger signal from the synthesizing circuitry is used to trigger acquisition ofmeasurement data. A single-channel front end acquires voltage scan data over one cycle of the test stimulus waveform following the trigger point. Current scan data is later acquired through the same acquisition circuitry beginning at the same trigger point relative to the start of a later cycle of the stimulus waveform, so that the voltage and current scan data, although acquired separately, are very closely synchronized relative to the stimulus waveform, as a result of which they maintain their phase relationship. Stored voltage and current scan data are aligned accordingly and concurrently displayed so as to form a Lissajous pattern on a small display. Theinvention thus provides improved component test capability in a small, portable instrument, including graphic display of test results.
申请公布号 CA2149848(A1) 申请公布日期 1996.02.12
申请号 CA19952149848 申请日期 1995.05.19
申请人 FLUKE CORPORATION 发明人 GIBSON, GREG S.
分类号 G01R13/20;G01R15/12;G01R27/28;G01R31/01;G01R31/26;G01R31/28;G09G5/00;(IPC1-7):G01R31/27;G01R13/00;G01R31/316 主分类号 G01R13/20
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