发明名称 |
Czochralsky-Verfahren unter Verwendung eines Bauelementes zum Abschirmen der Strahlung der Rohmaterial-Schmelzlösung und Vorrichtung hierfür. |
摘要 |
A Czochralski method using radiation intercepting members 1, 9 is applied to manufacture a single crystal such as compound semiconductors with high production yield from a material having a low thermal conductivity or with small temperature gradient. In this method, a coracle 6 having an opening is provided in a raw material molten solution contained in a crucible 3. A first member 1 is, then, provided on the coracle 6 to intercept a radiation from the raw material molten solution. A second member 9 supported by a crystal pulling shaft 8 is, then, provided on the first member 1 to cover a opening formed at the center of the first member 1. Seeding is, then, performed, intercepting the radiation with the first and the second member. After the seeding, a shoulder portion of a single crystal is formed intercepting the radiation with the members 1, 9. A cylindrical body of the single crystal is, then, pulled by the shaft 8 together with the members 1, 9. <IMAGE> |
申请公布号 |
DE69204198(T2) |
申请公布日期 |
1996.02.08 |
申请号 |
DE1992604198T |
申请日期 |
1992.03.31 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD., OSAKA, JP |
发明人 |
TATSUMI, MASAMI, C/O ITAMI WORKS OF SUMITOMO, ITAMI-SHI, HYOGO, JP;SAWADA, SHIN-ICHI, C/O ITAMI WORKS OF SUMITOMO, ITAMI-SHI, HYOGO, JP |
分类号 |
C30B15/14;(IPC1-7):C30B15/00 |
主分类号 |
C30B15/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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