发明名称 |
METHOD OF MAKING TRANSISTOR |
摘要 |
depositing a pad oxide layer and a nitride layer sequentially, patterning a photoresist layer, and removing the photoresist layer by etching the nitride and the pad oxide layers; of forming a spacer oxide layer on the side-wall of the etched nitride layer; implanting impurities to control the threshold voltage of transistor; depositing a gate oxide layer and a polysilicon layer sequentially and forming a gate electrode by etching back; and forming a source and a drain electrodes.
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申请公布号 |
KR960001613(B1) |
申请公布日期 |
1996.02.02 |
申请号 |
KR19920023082 |
申请日期 |
1992.12.02 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
INN, SUNG - WOOK |
分类号 |
H01L21/336;H01L29/78;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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