发明名称 WHEAT QUALITY JUDGING APPARATUS
摘要 PURPOSE:To obtain a wheat quality judging apparatus capable of simply and accurately measuring and judging the quality of wheat extending over a relatively wide range in moisture content in a non-ground state. CONSTITUTION:In a spectrum analyser 2, a light source 4, a measuring part 5 emitting luminous flux at the time of the measurement of a sample and a spectrum analyzing part 6 spectrally diffracting luminous flux are provided along an optical axis P and a luminous flux changeover mechanism 11 has a disc 12 and a luminous flux converting part 13. A data processing device 3 is equipped with a memory means 2001 storing a first quality calibration formula group corresponding to raw wheat obtaining the quality value group of a sample S containing a moisture content value from a spectrally separated absorbancy spectrum and a second quality calibration formula group corresponding to dry wheat. The first quality value group of the sample 3 is calculated on the basis of the first quality calibration formula group by a first quality value lead-out means 2002 and, when a first moisture content value is lower than a set value, the second quality value group of the sample S is calculated from the spectrum on the basis of the second quality calibration formula group by a second quality value lead-out means 2003 and quality is judged on the basis of the moisture content value.
申请公布号 JPH0829337(A) 申请公布日期 1996.02.02
申请号 JP19940164994 申请日期 1994.07.18
申请人 HOKKAIDO PREFECTURE;KUBOTA CORP 发明人 OMURA KUNIO;NAKATSU TOMOHITO;SHIMIZU AKIYOSHI;SUZUKI RYOJI
分类号 G01N21/35;(IPC1-7):G01N21/35 主分类号 G01N21/35
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