发明名称 |
WHEAT QUALITY JUDGING APPARATUS |
摘要 |
PURPOSE:To obtain a wheat quality judging apparatus capable of simply and accurately measuring and judging the quality of wheat extending over a relatively wide range in moisture content in a non-ground state. CONSTITUTION:In a spectrum analyser 2, a light source 4, a measuring part 5 emitting luminous flux at the time of the measurement of a sample and a spectrum analyzing part 6 spectrally diffracting luminous flux are provided along an optical axis P and a luminous flux changeover mechanism 11 has a disc 12 and a luminous flux converting part 13. A data processing device 3 is equipped with a memory means 2001 storing a first quality calibration formula group corresponding to raw wheat obtaining the quality value group of a sample S containing a moisture content value from a spectrally separated absorbancy spectrum and a second quality calibration formula group corresponding to dry wheat. The first quality value group of the sample 3 is calculated on the basis of the first quality calibration formula group by a first quality value lead-out means 2002 and, when a first moisture content value is lower than a set value, the second quality value group of the sample S is calculated from the spectrum on the basis of the second quality calibration formula group by a second quality value lead-out means 2003 and quality is judged on the basis of the moisture content value. |
申请公布号 |
JPH0829337(A) |
申请公布日期 |
1996.02.02 |
申请号 |
JP19940164994 |
申请日期 |
1994.07.18 |
申请人 |
HOKKAIDO PREFECTURE;KUBOTA CORP |
发明人 |
OMURA KUNIO;NAKATSU TOMOHITO;SHIMIZU AKIYOSHI;SUZUKI RYOJI |
分类号 |
G01N21/35;(IPC1-7):G01N21/35 |
主分类号 |
G01N21/35 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|