| 摘要 |
PURPOSE:To provide a Kossel image automatic analyzer which can automatically observe Kossel image accurately and rapidly in real time. CONSTITUTION:The Kossel diffraction image automatic analyzer consists of a Kossel diffraction image observation device 1 for observing a Kossel diffraction image by applying electron rays to a sample 21 and an image-processing/ analyzing device 2 for analyzing the azimuth and distortion of the crystal particle of the sample from the Kossel diffraction image obtained by the Kossel diffraction image observation device 1. And, the Kossel diffraction image observation device 1 consists of an electron ray generation device 11, an image tube 22-1 (22-2) with a scintillator laid out at a position where the Kossel diffraction image obtained by applying the electron rays generated from the electron ray generation device 11 to a sample can be projected, a CCD camera 23-2 (23-2) for picking up the Kossel diffraction image where light is intensified by the image tube, and a Be film 24-1 (24-2) provided at the front surface of the image tube. |
