发明名称 FORMING METHOD OF RESIST PATTERN AND FORMING METHOD OF METALLIC PATTERN USING AFOREMENTIONED FORMING METHOD
摘要 PURPOSE:To provide a photo-resist pattern suitable for forming an evaporation bump and a lift-off process utilizing the photo-resist pattern. CONSTITUTION:An alkali-soluble high-molecular material is used for a lower layer, and a two-layer resist layer employing an alkali developing negative type photo-resist composition containing (A) (a) an unsaturated carboxylic acid, (b) a radical polymerizable compound having an epoxy group, (c) a copolymer with other radical polymerizable compounds, (B) a polymerizable compound having at least one ethylene unsaturated double bond, and (C) a photopolymerization initiator is used for an upper layer, thus forming a resist pattern. A metal is evaporated, and the residual resist layer is lifted off together with an unnecessary metallic layer on the resist layer, thus forming a metallic pattern.
申请公布号 JPH0831733(A) 申请公布日期 1996.02.02
申请号 JP19940188877 申请日期 1994.07.19
申请人 JAPAN SYNTHETIC RUBBER CO LTD 发明人 CHIBA HIDEKI;OKUBO JUNICHI;NAITO MAKIKO;SHIODA ATSUSHI
分类号 G03F7/26;H01L21/027;H01L21/321;H01L21/60;(IPC1-7):H01L21/027 主分类号 G03F7/26
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