发明名称 Prevention of agglomeration and inversion in a semiconductor polycide process
摘要 <p>Conductors are fabricated by forming a layer of doped polysilicon (15) on a semiconductor substrate (5) having a gate oxide film (10) formed therein, forming a nitrogen-enriched conductive layer (20) on the layer of doped polysilicon. The structure is then conventionally capped with a dielectric film (22). Next, the nitrogen-enriched conductive layer and layer of doped polysilicon are patterned using a photoresist mask so as to form the conductors. The nitrogen contained in the nitrogen-enriched conductive layer provides for improved thermal stability thereof. &lt;MATH&gt;</p>
申请公布号 EP0694962(A2) 申请公布日期 1996.01.31
申请号 EP19950480074 申请日期 1995.06.09
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 GIEWONT, KENNETH JOHN;YU, ANTHONY J.
分类号 H01L21/28;H01L21/285;H01L21/324;H01L21/768;H01L29/78;(IPC1-7):H01L21/768;H01L21/320 主分类号 H01L21/28
代理机构 代理人
主权项
地址