发明名称 |
Prevention of agglomeration and inversion in a semiconductor polycide process |
摘要 |
<p>Conductors are fabricated by forming a layer of doped polysilicon (15) on a semiconductor substrate (5) having a gate oxide film (10) formed therein, forming a nitrogen-enriched conductive layer (20) on the layer of doped polysilicon. The structure is then conventionally capped with a dielectric film (22). Next, the nitrogen-enriched conductive layer and layer of doped polysilicon are patterned using a photoresist mask so as to form the conductors. The nitrogen contained in the nitrogen-enriched conductive layer provides for improved thermal stability thereof. <MATH></p> |
申请公布号 |
EP0694962(A2) |
申请公布日期 |
1996.01.31 |
申请号 |
EP19950480074 |
申请日期 |
1995.06.09 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
GIEWONT, KENNETH JOHN;YU, ANTHONY J. |
分类号 |
H01L21/28;H01L21/285;H01L21/324;H01L21/768;H01L29/78;(IPC1-7):H01L21/768;H01L21/320 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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