发明名称 Method for manufacturing self-aligned bipolar transistors using double diffusion
摘要 Manufacturing a double polysilicon layer self-aligned type bipolar transistor. A polysilicon layer for emitter impurity diffusion is formed prior to the formation of a polysilicon layer for leading out a base. A first polysilicon layer containing impurities for base impurity diffusion is deposited over the entire surface of a semiconductor structure. After the first polysilicon layer is patterned into a predetermined shape, an intrinsic base layer is formed by thermally diffusing impurities from a base impurity diffusion source. Subsequently, a second polysilicon layer containing emitter impurities is formed over the base impurity diffusion source, and then patterning is performed such that the first and second polysilicon layers remain in a region narrower than the base impurity diffusion source. Thereafter, an emitter layer is formed by thermal diffusion.
申请公布号 US5488002(A) 申请公布日期 1996.01.30
申请号 US19940302199 申请日期 1994.09.08
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KIMURA, KOJI;TAKA, SHIN-ICHI
分类号 H01L29/73;H01L21/331;H01L29/732;(IPC1-7):H01L21/265 主分类号 H01L29/73
代理机构 代理人
主权项
地址